HI-SCAN 6040-2is dual-view X-ray inspection system

Aug. 23, 2016
ASIS 2016 Booth #1451

Smiths Detection Inc. (SDI)’s HI-SCAN 6040-2is is an advanced, dual-view X-ray inspection system which uses multiple views and sophisticated algorithms to indicate items that might be threats. It offers ACSTL “Category A” screening for smaller items, items that will later be in pallets, or break bulk cargo, and meets TSA’s dual-view requirements. It can penetrate 35mm steel and provides a flexible, easy-to-use interface, which makes it a top choice for government buildings, hotels and other infrastructures where security checkpoints are required. It has also has been approved for EU Standard 3 Type C (LEDS) use in airport checkpoints across Europe. 

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